SX50 Hardware Configuration

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Cameca SX50 Electron Probe Microanalyzer.

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4 Wavelength-Dispersive Spectrometers arranged as three 2 crystal spectrometers (LiF-PET, TAP-PC1, and LiF-PET) and one 4 crystal spectrometer (PET, TAP, PC2 and PC3). The PCx Pseudo-Crystals (or LSM's) are customized diffractors specifically developed for light-element sensitivity - Be, B, C, N, O and F)

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EDS Detector with a state-of-the-art high-throughput, Digital Pulse Processor

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High-resolution channel-guide secondary electron detector

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Solid-state Backscattered electron detector hexagonally arranged for superior elemental contrast

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Anticontamination system with LN2 cold finger and gas jet for high sensitivity light element analysis

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Dual magnification Optical light microscope (40-400X), color CCD camera and digitization electronics for capturing optical images

 

 

SX50 Automation and Software Configuration

The SX50 is automated with the full SAMx software and hardware suite. (Analyze This! is the first user of the SAMx software for EPMA, dating back to 1991. Take a look at the SAMx web here. SAMx is a French company of microanalysis experts who have developed extremely powerful and efficient software for the Electron Probe analytical industry. It is managed by Dr. Jean-Francois Thiot who is one of the most respected experts in the Electron Probe Microanalysis area.)

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XMAS Automation

XMAS is the automation package that controls our SX50 wavelength and energy dispersive spectrometers. XMAS adds great efficiency to the operation of our instrument allowing for much more economical analyses of your specimens. Unattended, overnight operation is routinely carried out and frequently our customers’ results are available within 24-48 hours of specimen receipt.

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HiMax Imaging and Elemental Mapping

HiMax is a powerful imaging package consisting of hardware and software running on a PC platform. HiMax allows our SX50 to digitally acquire video images (SE, BSE, ABS,…) simultaneously with X-ray signals (Combined EDS and WDS maps)

Our SX50 is capable of simultaneously mapping up to 15 elements (Combined EDS+WDS)! along with simultaneous secondary electron and  backscattered electron image acquisition.

Take a look at an example: FAST Mapping of a Tool  Steel

Large-area stage mapping with accuracy. Optically encoded mechanical specimen stage ensures sub-micron accuracy on areas as large as 50x50mm 

 

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IDFix EDS Package

IDFix is the EDS software package that gives our SX50 the ability to collect, display and reduce EDS spectrum data. IDFix is integrated with both XMAS and HiMax to allow true WDS/EDS integration for elemental mapping and quantitative analysis. IDFix, combined with our NumeriX Digital Pulse Processor allows for extremely high x-ray pulse throughputs of up to 300,000 cps/channel at reasonable deadtimes!

Elemental Spatial Distributions
Take a look at some elemental distribution Large Area Mapping from our  electron probe

Catalyst Poisoning

 

 

 

Also Some Beam mapping

Cross Section of a Plated Steel

 

And  Some Really Large Area Stage Mapping!

Cross Section of a Fracture in the Root of a Human Tooth (with Root Canal, Metal Post and Crown)